A Site Observation Directed Test Pattern Generation Method for Reducing Defective Part Level
نویسندگان
چکیده
Traditional testing methods attempt to maximize the number of single stuck-at faults detected by the test pattern set applied to minimize defective part level after IC manufacture and prior to shipment. However, stuck-at faults no longer map closely to actual defects in current CMOS technologies. This work optimizes the probability of defect detection -in contrast to the stuck-at fault detection.
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